Thickness-Dependent Optical Nonlinearities of Nanometer-Thick
Sb2Te3 Thin Films: Implications for Mode-Locking
and Super-resolved Direct Laser Writing
Posted on 2020-07-27 - 04:36
2D materials are
currently very promising candidates for various
photonic applications. Optimizing their optical nonlinearities requires
a thorough adjustment of several properties including the film thickness.
In this work thin Sb2Te3 layers with different
thicknesses (ranging from 2.5 to 50 nm) are prepared by the electron
beam deposition technique, and then they are properly annealed in
order to achieve significant third order nonlinearities. The film
structure and morphology are extensively studied by means of X-ray
diffraction, scanning electron microscopy, transmission electron microscopy
and energy-dispersive X-ray spectroscopy. The presence of nanocrystals
with sizes highly depending on the film thickness has been observed.
Optical studies are carried out by Vis–NIR spectrophotometric
studies. Finally, a thickness dependent study of the ultrafast third
order nonlinear optical properties of the Sb2Te3 thin films is performed. This study is carried out by means of the
Z-scan technique, employing 400 fs laser pulses at 1030 nm. The observed
optical nonlinearities are very high, compared with those of state-of-the-art
nonlinear optical materials. Moreover they are highly dependent on
the thickness of the layers. The findings demonstrate the importance
of a fine adjustment of the Sb2Te3 thickness
in order to enhance its nonlinear optical efficiency. They are expected
to be of significant importance for mode-locking of laser systems
and super-resolved direct laser writing.
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Verrone, Richard-Nicolas; Moisset, Charles; Lemarchand, Fabien; Campos, Andrea; Cabié, Martiane; Perrin-Pellegrino, Carine; et al. (2020). Thickness-Dependent Optical Nonlinearities of Nanometer-Thick
Sb2Te3 Thin Films: Implications for Mode-Locking
and Super-resolved Direct Laser Writing. ACS Publications. Collection. https://doi.org/10.1021/acsanm.0c01445