Thermal Atomic
Layer Etching of Molybdenum Using Sequential
Oxidation and Deoxychlorination Reactions
Posted on 2024-01-29 - 17:06
Thermal atomic layer etching (ALE) of molybdenum (Mo)
was demonstrated
using sequential exposures of O3 (ozone) and SOCl2 (thionyl chloride). In situ quartz crystal microbalance (QCM) studies
were performed on sputtered Mo-coated QCM crystals. The QCM results
revealed that Mo ALE displayed a linear mass decrease versus ALE cycles
after a short etching delay. A pronounced mass increase was observed
for every O3 exposure. A dramatic mass decrease occurred
for every SOCl2 exposure. The mass change per cycle (MCPC)
for Mo ALE was self-limiting after long SOCl2 exposures.
The MCPC increased slightly with longer O3 exposure times.
In situ QCM studies suggested that this soft saturation with longer
exposure to the O3 resulted from the diffusion-limited
oxidation of Mo. The Mo etch rate increased progressively with etching
temperature. Under saturation conditions, the Mo etch rates were 0.94,
5.77, 8.83, and 10.98 Å/cycle, at 75, 125, 175, and 225 °C,
respectively. X-ray photoelectron spectroscopy (XPS) and in situ quadruple
mass spectroscopy (QMS) studies were conducted to understand the reaction
mechanism. XPS revealed primarily MoO3 on the Mo surface
after exposure to O3 at 150 °C. From the QMS studies,
volatile SO2 and MoO2Cl2 were monitored
when Mo was exposed to SOCl2 during the ALE cycles at 200
°C. These results indicate that Mo ALE occurs via oxidation and
deoxychlorination reactions. Mo is oxidized to MoO3 by
O3. Subsequently, MoO3 undergoes a deoxychlorination
reaction where SOCl2 accepts oxygen to yield SO2 and donates chlorine to produce MoO2Cl2. Additional
QCM experiments revealed that sequential exposures of O3 and SO2Cl2 (sulfuryl chloride) did not etch
Mo at 250 °C. Time-resolved QMS studies at 200 °C also compared
sequential O3 and SOCl2 or SO2Cl2 exposures on Mo at 200 °C. The volatile release of MoO2Cl2 was observed only using the SOCl2 deoxychlorination reactant. Atomic force microscopy (AFM) measurements
revealed that the roughness of the Mo surface increased slowly versus
Mo ALE cycles.
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Nam, Taewook; Colleran, Troy A.; Partridge, Jonathan L.; Cavanagh, Andrew S.; George, Steven M. (2024). Thermal Atomic
Layer Etching of Molybdenum Using Sequential
Oxidation and Deoxychlorination Reactions. ACS Publications. Collection. https://doi.org/10.1021/acs.chemmater.3c02606