Morphological Transitions in Organic Ultrathin Film
Growth Imaged by In Situ Step-by-Step Atomic Force Microscopy
Version 2 2020-06-12, 16:07
Version 1 2020-06-11, 11:36
Posted on 2020-06-12 - 16:07
In
situ atomic force microscopy (AFM) allowed us to investigate
the evolution at the early stages of the growth of organic thin films.
An ultrahigh-vacuum atomic force microscope, integrated with a Knudsen
effusion cell for the sublimation of α-sexithiophene (6T), continuously scans the same region during the deposition
of sublimed molecules on native silicon oxide as a function of the
substrate temperature. Noncontact AFM images acquired sequentially
provide snapshots of the time evolution of the film morphology that
is monitored up to the deposition of five monolayers. At all substrate
temperatures, a Stranski–Krastanov growth mode of organic films
is observed: the first two monolayers grow layer-by-layer (two-dimensional2D),
then films evolve into islands (three-dimensional3D). Despite
the apparent similarity, we find an anomalous dynamic scaling characterized
by the abrupt change of the growth exponent β vs substrate temperature.
This novel transition, induced by the substrate temperature, is ascribed
to the morphological transition from ziggurat islands to large terraces.
The analysis of the evolution of the root-mean-square (RMS) roughness
based on the distributed growth model underlines the role of down-hill
mass transport for the growth of the first two monolayers, transport
that is progressively hindered for the next monolayers.
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Chiodini, Stefano; Straub, Andreas; Donati, Stefano; Albonetti, Cristiano; Borgatti, Francesco; Stoliar, Pablo; et al. (2020). Morphological Transitions in Organic Ultrathin Film
Growth Imaged by In Situ Step-by-Step Atomic Force Microscopy. ACS Publications. Collection. https://doi.org/10.1021/acs.jpcc.0c03279
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AUTHORS (8)
SC
Stefano Chiodini
AS
Andreas Straub
SD
Stefano Donati
CA
Cristiano Albonetti
FB
Francesco Borgatti
PS
Pablo Stoliar
MM
Mauro Murgia
FB
Fabio Biscarini