In Situ TEM Characterization of Shear-Stress-Induced Interlayer Sliding in the Cross Section View of Molybdenum Disulfide
mediaposted on 24.02.2015 by Juan Pablo Oviedo, Santosh KC, Ning Lu, Jinguo Wang, Kyeongjae Cho, Robert M. Wallace, Moon J. Kim
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The experimental study of interlayer sliding at the nanoscale in layered solids has been limited thus far by the incapability of mechanical and imaging probes to simultaneously access sliding interfaces and overcome through mechanical stimulus the van der Waals and Coulombic interactions holding the layers in place. For this purpose, straightforward methods were developed to achieve interlayer sliding in molybdenum disulfide (MoS2) while under observation within a transmission electron microscope. A method to manipulate, tear, and slide free-standing atomic layers of MoS2 is demonstrated by electrostatically coupling it to an oxidized tungsten probe attached to a micromanipulator at a bias above ±7 V. A first-principles model of a MoS2 bilayer polarized by a normal electric field of 5 V/nm, emanating from the tip, demonstrates the appearance of a periodic negative sliding potential energy barrier when the layers slide into the out-of-registry stacking configuration, hinting at electrostatic gating as a means of modifying the interlayer tribology to facilitate shear exfoliation. A method to shear focused ion beam prepared MoS2 cross section samples using a nanoindenter force sensor is also demonstrated, allowing both the observation and force measurement of its interlayer dynamics during shear-induced sliding. From this experiment, the zero normal load shear strength of MoS2 can be directly obtained: 25.3 ± 0.6 MPa. These capabilities enable the site-specific mechanical testing of dry lubricant-based nanoelectromechanical devices and can lead to a better understanding of the atomic mechanisms from which the interlayer tribology of layered materials originates.