posted on 2014-11-19, 00:00authored byAlexander V. Senichev, Vadim
G. Talalaev, Igor V. Shtrom, Horst Blumtritt, George
E. Cirlin, Jörg Schilling, Christoph Lienau, Peter Werner
GaAs nanowires (NWs) exhibit different,
zinc blende (ZB) and wurzite
(WZ), crystalline phases and one generally finds an uncontrolled switching
between both phases on a scale of 1–10 nm. The change of crystalline
structure and stacking fault density strongly affects the local confinement
potential of GaAs NWs. Combining low temperature near-field spectroscopic
imaging and transmission electron microscopy measurements performed
on the very same individual GaAs nanowire allows us to gain an understanding
of the local structure–property correlations in such wires.
From the photoluminescence measurements at subwavelength spatial resolution
local characteristics of the band structure are derived. In particular,
our method enables us to assign the observed band gap reduction to
the high level of impurity dopants and to distinguish emission from
ZB-type regions and from periodically twinned superlattice regions.
In this way we demonstrate the ability to trace spatial variations
of the crystal structure along the wire axis by all-optical means.
Our results provide direct and quantitative insight into the correlations
between morphology and optics of GaAs nanowires and hence present
an important step toward band gap engineering of nanowires by controlled
crystal phase formation.