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Download fileDirect Visualization and Manipulation of Stacking Orders in Few-Layer Graphene by Dynamic Atomic Force Microscopy
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posted on 2021-07-28, 20:09 authored by Hongjian Wu, Xiaoxiang Yu, Mengjian Zhu, Zhihong Zhu, Jianyu Zhang, Sen Zhang, Shiqiao Qin, Guang Wang, Gang Peng, Jiayu Dai, Kostya S. NovoselovStacking order plays a central role
in governing a wide range of
properties in layered two-dimensional materials. In the case of few-layer
graphene, there are two common stacking configurations: ABA and ABC
stacking, which have been proven to exhibit dramatically different
electronic properties. However, the controllable characterization
and manipulation between them remain a great challenge. Here, we report
that ABA- and ABC-stacked domains can be directly visualized in phase
imaging by tapping-mode atomic force microscopy with much higher spatial
resolution than conventional optical spectroscopy. The contrasting
phase is caused by the different energy dissipation by the tip–sample
interaction. We further demonstrate controllable manipulation on the
ABA/ABC domain walls by means of propagating stress transverse waves
generated by the tapping of tip. Our results offer a reliable strategy
for direct imaging and precise control of the atomic structures in
few-layer graphene, which can be extended to other two-dimensional
materials.