posted on 2022-12-14, 14:35authored bySiddarth
K. Achar, Julian Schneider, Derek A. Stewart
Chalcogenide alloys are key materials for selector and
memory elements
used in next-generation nonvolatile memory cells. However, the high
electric fields and Joule heating experienced during operation can
promote interdiffusion at the interfaces that degrade device performance
over time. A clear atomic scale understanding of how chalcogenide
alloys interact with electrodes could aid in identifying ways to improve
long-term device endurance. In this work, we develop a robust set
of moment tensor potentials (MTPs) to examine interactions between
Ge–Se alloys and Ti electrodes. Previous works have shown evidence
of strong interactions between Ti and chalcogenide alloys. This system
offers an important first test in the use of ML empirical potentials
to understand the role of interfaces in endurance in memory elements
and broader nanoscale devices. The empirical potentials are constructed
using an active learning moment tensor potential framework that leverages
a broad data set of first-principles calculations for Ti, Ge, and
Se compounds. Long-term simulations (>1 ns) show significant interdiffusion
at the Ti|Ge–Se interface with Ti and Se both actively moving
across the original interface. The strong chemical affinity of Ti
and Se leads to a well-defined Ti–Se region and a severely
Se-depleted central Ge–Se region with unfavorable selector
characteristics. The evolution of the Ti–Se layer can be described
using a self-limited growth model. By comparing effective Ti–Se
diffusion constants for simulations at different temperatures, we
find a low activation energy of 0.1 eV for Ti–Se layer interdiffusion.