posted on 2002-03-19, 00:00authored byCharles J. Taylor, Steve Semancik
An approach for high-throughput rapid screening of chemical vapor deposition (CVD)
materials using micromachined silicon microheater arrays is described. To illustrate this
approach, titanium dioxide was deposited by CVD, using titanium(IV) nitrate and titanium(IV) isopropoxide at temperatures between 130 and 815 °C. Deposition was confined to the
microhotplate elements within 4- and 16-element arrays. Film microstructure was examined
by scanning electron microscopy. In situ electrical measurements were made with integrated
microcontacts during the deposition of TiO2 using titanium(IV) isopropoxide. A novel approach
using temperature-programmed deposition with temperature ramp rates up to 800 °C/s was
also employed for microstructure modification during deposition. Additionally, the steep
temperature gradients present on the microhotplate supports have been demonstrated to
provide an excellent platform for investigating temperature-dependent microstructures.