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Unraveling the Near- and Far-Field Relationship of 2D Surface-Enhanced Raman Spectroscopy Substrates Using Wavelength-Scan Surface-Enhanced Raman Excitation Spectroscopy
journal contribution
posted on 2017-06-22, 00:00 authored by Dmitry Kurouski, Nicolas Large, Naihao Chiang, Anne-Isabelle Henry, Tamar Seideman, George C. Schatz, Richard P. Van DuyneLithographic
and nonlithographic two-dimensional (2D) substrates
for surface-enhanced Raman spectroscopy (SERS) have gained enormous
popularity as analytical platforms for detection and identification
of various analytes. However, their near- and far-field properties
in most cases remain poorly understood. We have previously developed
a metal nanopillar film over nanospheres (FON) platform exhibiting
Raman enhancement factors of ∼107. These substrates
have a reproducible and predictable localized surface plasmon resonance
throughout the entire visible region and much of the near-IR region
of the electromagnetic spectrum. Extending upon these results, we
have utilized wavelength-scan surface-enhanced Raman excitation spectroscopy
to unravel the relationship between near- and far-field properties
of FON surface-enhanced Raman spectroscopy substrates. We examined
by scanning electron microscopy FONs fabricated by either stationary
(ST-FONs) or spun (SP-FONs) metal deposition to examine the interrelationships
of nanoscale structure and near- and far-fied properties. We demonstrate
that the line width and spectral position of the far-field and near-field
resonances of ST- and SP-FONs directly depend on the nanofeature distribution
at the metallic surface. In particular, we show that the actual nanofeature
morphology and distribution directly impact the spectral alignment
of the far-field and near-field resonances.
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far-field properties2 D Surface-Enhanced Raman Spectroscopy SubstratesSERSRaman enhancement factorsmetal nanopillar filmsurface-enhanced Raman spectroscopyWavelength-Scan Surface-Enhanced Raman Excitation Spectroscopy LithographicST-FONSTSP-FONsurface plasmon resonancenear-field resonancesscanning electron microscopy FONsFON surface-enhanced Raman spectroscopy substrateswavelength-scan surface-enhanced Raman excitation spectroscopy
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