posted on 2017-09-11, 00:00authored byChih-Hao Hsu, Kan Yue, Jing Wang, Xue-Hui Dong, Yanfeng Xia, Zhang Jiang, Edwin L. Thomas, Stephen Z. D. Cheng
Controlling self-assembled nanostructures
in thin films allows
the bottom-up fabrication of ordered nanoscale patterns. Here we report
the unique thickness-dependent phase behavior in thin films of a bolaform-like
giant surfactant, which consists of butyl- and hydroxyl-functionalized
polyhedral oligomeric silsesquioxane (BPOSS and DPOSS) cages telechelically
located at the chain ends of a polystyrene (PS) chain with 28 repeating
monomers on average. In the bulk, BPOSS-PS28-DPOSS forms
a double gyroid (DG) phase. Both grazing incidence small-angle X-ray
scattering and transmission electron microscopy techniques are combined
to elucidate the thin film structures. Interestingly, films with thicknesses
thinner than 200 nm exhibit an irreversible phase transition from
hexagonal perforated layer (HPL) to compressed hexagonally packed
cylinders (c-HEX) at 130 °C, while films with thickness larger
than 200 nm show an irreversible transition from HPL to DG at 200
°C. The thickness-controlled transition pathway suggests possibilities
to obtain diverse patterns via thin film self-assembly.