posted on 2025-04-21, 13:33authored byEui-Cheol Shin, Youngho Kang, Sang Ho Jeon
This study presents a fundamental investigation into
nitrogen complex
in group-III nitrides using first-principles calculations, revealing
the thermodynamic mechanisms governing vacancy cluster formation under
different charge states. We find that nitrogen complexes drive agglomeration
of vacancies in (Al, Ga)N through hole compensation and structural
reconfiguration, while in n-type conditions and antibonding
interactions introduce instability. InN exhibits a distinct behavior,
maintaining robust VCs across doping conditions due to the unique
role of metal–metal bonding, particularly indium trimer states,
which suppress defect-driven instabilities. Our results highlight
the intricate interplay between charge states, nitrogen complex, and
bonding nature in shaping defect stability, offering new insights
into defect engineering for nitride-based semiconductor applications.