posted on 2016-07-21, 00:00authored byJalal Arjomandi, Davood Raoufi, Fatemeh Ghamari
Statistical,
morphological, and fractal analyses of the conducting
polypyrrole (PPy) thin films during polymer growth on the indium tin
oxide (ITO) glass electrode were investigated. Cyclic voltammetry
(CV) was used to synthesize polymer thin films with different thicknesses
and for calculation of fractal dimensions (Df). Atomic force microscopy (AFM) as a powerful technique was
employed to statistically study and analyze the morphology of different
types of thin film surfaces with parameters such as root mean square
(RMS), kurtosis (Ku), skewness (Sk), and Df. In calculating the fractal
dimensions from AFM images of different thin films, power spectral
density, perimeter–area, and box-counting methods were used.
The results show that the fractal dimensions increased with increasing
thicknesses of the films. RMS, Ku, and Sk parameters of the films were changed with increasing film thicknesses.
Moreover, X-ray diffraction (XRD) analysis technique confirmed the
process of growing polymers on polycrystalline indium tin oxide (ITO)
and increasing the crystallinity of PPy during film growth.