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Substrate-Determined Shape of Free Surface Profiles in Spin-Cast Polymer Blend Films

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journal contribution
posted on 02.05.2003, 00:00 by A. Budkowski, A. Bernasik, P. Cyganik, J. Raczkowska, B. Penc, B. Bergues, K. Kowalski, J. Rysz, J. Janik
Sectional views of thin films of symmetric polystyrene/polyisoprene (PS/PI) blends spin-cast from toluene (C6H5CH3) onto CH3- and COOH-terminated self-assembled monolayers (CH3−SAM and COOH−SAM) show concave- (sharp-edged) and convex-shaped (round) protrusions, respectively, while other morphology features are identical. A 3-dimensional phase domain arrangement was determined with spectroscopic techniques (profiling and mapping mode of dynamic secondary ion mass spectrometry, dSIMS, and X-ray photoelectron spectroscopy). Surface topography was examined with atomic force microscopy and monitored, during the dSIMS analysis, with secondary electrons. In addition, solvent evaporation from PS, PI, and PS/PI layers cast on CH3−SAM and COOH−SAM was determined. The collected data were used to put forward a model of morphology formation and to elucidate the role of evaporation speed dependent on substrate chemistry in this process, demonstrated here for the first time.

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