posted on 2022-02-11, 10:43authored byJi-Young Go, Huihui Zhu, Youjin Reo, Hyunjun Kim, Ao Liu, Yong-Young Noh
Two-dimensional metal halide perovskites
(2D MHPs) are promising
candidates for transistor channel materials because of their high
mobility in the lateral direction; however, Sn-based 2D MHPs exhibit
poor film quality and oxidation stability. Here, we report a simple
method to improve the performance and stability of 2D MHP transistors
by incorporating sodium iodide (NaI) additives. By adding 1 vol %
NaI (Na1), the transistors with phenethylammonium tin iodide (PEA<sub>2</sub>SnI<sub>4</sub>) exhibited reduced dual-sweep hysteresis,
robust bias stability, and larger hole mobility (2.13 cm<sup>2</sup> V<sup>–1</sup> s<sup>–1</sup>) than that of a pristine
device (0.39 cm<sup>2</sup> V<sup>–1</sup> s<sup>–1</sup>). Improvements in the film quality, such as increased grain size,
crystallinity, and better film coverage, were observed in the PEA<sub>2</sub>SnI<sub>4</sub>:NaI film. In addition, NaI effectively passivated
the iodine vacancies at the grain boundaries, thereby suppressing
the defects.