posted on 2015-12-17, 06:08authored byTiphaine Bourgeteau, Steven Le Vot, Michael Bertucchi, Vincent Derycke, Bruno Jousselme, Stéphane Campidelli, Renaud Cornut
The present work investigates the
electronic conduction of reduced
graphene oxide flakes and the coupling between flakes through a combined
SECM (scanning electrochemical microscopy), AFM, and SEM analysis.
Images of individual and interconnected flakes directly reveal the
signature of the contact resistance between flakes in a noncontact
and substrate-independent way. Quantitative evaluation of the parameters
is achieved with the support of numerical simulations to interpret
the experimental results. The interflakes contact resistance importantly
impacts the transport of electrons, which can be anticipated as a
key parameter in r-GO-based materials used in fuel cells, lithium
batteries, supercapacitors, and organic electronic devices.