posted on 2018-06-07, 00:00authored byQianchun Weng, Kuan-Ting Lin, Kenji Yoshida, Hirofumi Nema, Susumu Komiyama, Sunmi Kim, Kazuhiko Hirakawa, Yusuke Kajihara
Probing
spatial variation of temperature at the nanoscale provides
key information for exploring diverse areas of modern science and
technology. Despite significant progress in the development of contact
thermometers with high spatial resolution, one inherent disadvantage
is that the quantitative analysis of temperature can be complicated
by the direct thermal contact. On the other hand, noncontact infrared
radiation thermometer is free from such contact-induced disturbance,
but suffers from insufficient spatial resolution stemming from diffraction-limit
in the micrometer range. Combining a home-built sensitive infrared
microscope with a noncontact scattering probe, we detected fluctuating
electromagnetic evanescent fields on locally heated material surface,
and thereby mapped temperature distribution in subwavelength scales.
We visualize nanoscale Joule heating on current-carrying metal wires
and find localized “hot-spots” developing along sharp
corners of bended wires in the temperature mapping. Simulation calculations
give quantitative account of the nanoscale temperature distribution,
definitely indicating that the observed effect is caused by the nonuniform
energy dissipation due to the current-crowding effect. The equipment
in this work is a near-field version of infrared radiation thermometer
with a spatial resolution far below the detection wavelength (<100
nm, or λ/140) in which local temperature distribution of operating
nanoscale devices can be noninvasively mapped with a temperature resolution
∼2 K at room-temperature.