The efficient and safe manipulation of precision materials
(such
as thin and fragile wafers and glass substrates for flat panel displays)
under complicated operating conditions with vacuum, high temperature,
and low preload stress is an essential task for pan-semiconductor
production lines. However, current manipulation approaches such as
suction-based gripping (invalid under vacuum conditions) and mechanical
clamping (stress concentration at the contact interfaces) are challenged
to satisfy such complex requirements. Herein, fluororubber (FKM) is
employed as an adhesive material to overcome such challenges due to
its outstanding thermostability, availability under vacuum environments,
and high adhesion at low contacting preloads. However, the adhesion
of the FKM film decreases significantly with increasing temperature
(decrease by 84.83% at 245 °C). Consequently, a micropatterned
FKM-based dry adhesive (MFA) fabricated by laser etching is developed.
The experimental results reveal that MFAs are efficient in restraining
adhesion attenuation at high temperatures (minimum 15% decrease at
245 °C). The numerical analysis and in situ observations reveal
the mechanism of the MFAs in restraining adhesion attenuation. The
contamination-free and high adhesion at low contacting preload of
MFAs can be of great interest in pan-semiconductor production lines
that require complicated operating conditions on temperature, vacuum,
and interface stress.