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Low Energy Electron Induced DNA Damage: Effects of Terminal Phosphate and Base Moieties on the Distribution of Damage

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posted on 2008-04-30, 00:00 authored by Zejun Li, Yi Zheng, Pierre Cloutier, Léon Sanche, J. Richard Wagner
Low Energy Electron Induced DNA Damage: Effects of Terminal Phosphate and Base Moieties on the Distribution of Damage

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    Journal of the American Chemical Society

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    Terminal PhosphateLow Energy Electron Induced DNA DamageDamageLow Energy Electron Induced DNA DamageBase Moieties

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