posted on 2013-12-26, 00:00authored bySaman
Safari Dinachali, Jarrett Dumond, Mohammad S. M. Saifullah, Kwadwo Konadu Ansah-Antwi, Ramakrishnan Ganesan, Eng San Thian, Chaobin He
Step-and-flash imprint lithography
(S-FIL) is a wafer-scale, high-resolution nanoimprint technique capable
of expansion of nanoscale patterns via serial patterning of imprint
fields. While S-FIL patterning of organic resins is well known, patterning
of metal–organic resins followed by calcination to form structured
oxide films remains relatively unexplored. However, with calcination
shrinkage, there is tremendous potential utility in easing accessibility
of arbitrary nanostructures at 20 nm resolution and below. However,
barriers to commercial adoption exist due to difficulties in formulating
polymerizable oxide precursors with good dispensability, long shelf
life, and resistance to auto-homopolymerization. Here we propose a
solution to these issues in the form of a versatile resin formulation
scheme that is applicable to a host of functional oxides (Al2O3, HfO2, TiO2, ZrO2,
Ta2O5, and Nb2O5). This
scheme utilizes a reaction of metal alkoxides with 2-(methacryloyloxy)ethyl
acetoacetate (MAEAA), a polymerizable chelating agent. Formation of
these inorganic coordination complexes enables remarkable resistance
to auto-homopolymerization, greatly improving dispensability and shelf
life, thus enabling full scale-up of this facile nanofabrication approach.
Results include successively imprinted fields consisting of 100 nm
linewidth gratings. Isothermal calcination of these structures resulted
in corresponding shrinkage of 75–80% without loss of mechanical
integrity or aspect ratio, resulting in 20 nm linewidth oxide nanostructures.