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Improved Imaging of Soft Materials with Modified AFM Tips

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journal contribution
posted on 22.07.1999, 00:00 by Richard D. Piner, Seunghun Hong, Chad A. Mirkin
Herein, we report a simple method for making silicon nitride tips hydrophobic without significantly changing their shape. Specifically, we show that atomic force microscope (AFM) tips coated with physisorbed multilayers of 1-dodecylamine, when used in air, offer enhanced resolution for both organic and inorganic materials. The reason for this is due to a significant reduction in the capillary effect associated with water condensation between the tip and substrate.