posted on 2019-08-19, 15:44authored byBruno Schuler, Jun-Ho Lee, Christoph Kastl, Katherine A. Cochrane, Christopher T. Chen, Sivan Refaely-Abramson, Shengjun Yuan, Edo van Veen, Rafael Roldán, Nicholas J. Borys, Roland J. Koch, Shaul Aloni, Adam M. Schwartzberg, D. Frank Ogletree, Jeffrey B. Neaton, Alexander Weber-Bargioni
Control
of impurity concentrations in semiconducting materials
is essential to device technology. Because of their intrinsic confinement,
the properties of two-dimensional semiconductors such as transition
metal dichalcogenides (TMDs) are more sensitive to defects than traditional
bulk materials. The technological adoption of TMDs is dependent on
the mitigation of deleterious defects and guided incorporation of
functional foreign atoms. The first step toward impurity control is
the identification of defects and assessment of their electronic properties.
Here, we present a comprehensive study of point defects in monolayer
tungsten disulfide (WS2) grown by chemical vapor deposition
using scanning tunneling microscopy/spectroscopy, CO-tip noncontact
atomic force microscopy, Kelvin probe force spectroscopy, density
functional theory, and tight-binding calculations. We observe four
different substitutional defects: chromium (CrW) and molybdenum
(MoW) at a tungsten site, oxygen at sulfur sites in both
top and bottom layers (OS top/bottom), and two negatively
charged defects (CD type I and CD type II). Their electronic fingerprints
unambiguously corroborate the defect assignment and reveal the presence
or absence of in-gap defect states. CrW forms three deep
unoccupied defect states, two of which arise from spin–orbit
splitting. The formation of such localized trap states for CrW differs from the MoW case and can be explained
by their different d shell energetics and local strain, which we directly
measured. Utilizing a tight-binding model the electronic spectra of
the isolectronic substitutions OS and CrW are
mimicked in the limit of a zero hopping term and infinite on-site
energy at a S and W site, respectively. The abundant CDs are negatively
charged, which leads to a significant band bending around the defect
and a local increase of the contact potential difference. In addition,
CD-rich domains larger than 100 nm are observed, causing a work function
increase of 1.1 V. While most defects are electronically isolated,
we also observed hybrid states formed between CrW dimers.
The important role of charge localization, spin–orbit coupling,
and strain for the formation of deep defect states observed at substitutional
defects in WS2 as reported here will guide future efforts
of targeted defect engineering and doping of TMDs.