posted on 2019-01-31, 17:49authored byTongxin Chen, Yuewen Sheng, Yingqiu Zhou, Ren-jie Chang, Xiaochen Wang, Hefu Huang, Qianyang Zhang, Linlin Hou, Jamie H. Warner
We show that reducing the degree
of van der Waals overlapping in
all 2D ultrathin lateral devices composed of graphene:WS2:graphene leads to significant increase in photodetector responsivity.
This is achieved by directly growing WS2 using chemical
vapor deposition (CVD) in prepatterned graphene gaps to create epitaxial
interfaces. Direct-CVD-grown graphene:WS2:graphene lateral
photodetecting transistors exhibit high photoresponsivities reaching
121 A/W under 2.7 × 105 mW/cm2 532 nm illumination,
which is around 2 orders of magnitude higher than similar devices
made by the layer-by-layer transfer method. The photoresponsivity
of our direct-CVD-grown device shows negative correlation with illumination
power under different gate voltages, which is different from similar
devices made by the transfer method. We show that the high photoresponsivity
is due to the lowering of effective Schottky barrier height by improving
the contact between graphene and WS2. Furthermore, the
direct CVD growth reduces overlapping sections of WS2:Gr
and leads to more uniform lateral systems. This approach provides
insights into scalable manufacturing of high-quality 2D lateral electronic
and optoelectronic devices.