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Grain Boundary Mapping in Polycrystalline Graphene

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journal contribution
posted on 22.03.2011, 00:00 by Kwanpyo Kim, Zonghoon Lee, William Regan, C. Kisielowski, M. F. Crommie, A. Zettl
We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon−heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.

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