posted on 2024-06-11, 14:34authored byOleksii Bezkrovnyi, Maja Szymczak, Lukasz Marciniak, Piotr Kraszkiewicz, Vitalii Boiko, Michael Vorochta, Iva Matolínová, Leszek Kepinski
Complex luminescence,
structure (powder XRD, Raman spectroscopy),
and reducibility (NAP-XPS and H2-TPR) studies carried out
on classic ceria-based materials have allowed us to develop a new
luminescence-based technique for fast monitoring of the chemical state
of a ceria catalyst under operating conditions. The proposed approach
involves a remote structural probe based on Eu3+ luminescence
to probe the Ce3+/Ce4+ ratio in the ceria matrixa
crucial factor in determining the catalytic activity of ceria-based
materials. The sensitivity, remote readout mode, and simplicity of
the proposed method, as well as its good correlation with a classic
direct technique for the in situ study of the chemical state of materials
(NAP-XPS) opens up new possibilities to control the state of the working
catalysts in real industrial processes.