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Download fileEpitaxial Growth of Multilayered Metal–Organic Framework Thin Films for Electronic and Photonic Applications
journal contribution
posted on 03.03.2021, 22:08 authored by Ken Ikigaki, Kenji Okada, Masahide TakahashiMultilayered
metal–organic frameworks (MOF) thin films,
called MOF-on-MOF thin films, generate integrated and multiple functionalities
toward high-performance sensing, electrochemical, and optical devices.
Although epitaxy at the MOF/MOF interfaces in these multilayered MOF
films plays a crucial role for high functionalities, the effect of
structural consistency at a molecular scale at the epitaxial interface
on the quality of the films (e.g., crystallite size and degree of
orientation of MOF-on-MOF thin films) has not been explored. Here,
we report the factors governing such physical parameters by revealing
a relationship between lattice mismatch ratios and orientations of
MOF-on-MOF thin films with epitaxial interfaces (referred as to “e-MoM
thin films”). Highly oriented e-MoM thin films were successfully
obtained by considering not only lattice mismatch ratios but also
stacking order depending on the lattice parameters of MOF components.
Because of the chemical and structural tunability of e-MoM materials,
the present finding will offer insight into fabricating e-MoM thin
films for designing future MOF-based devices.