Two-dimensional nanomaterials
such as reduced graphene oxide (rGO)
have captured significant attention in the realm of field-effect transistor
(FET) sensors due to their inherent high sensitivity and cost-effective
manufacturing. Despite their attraction, a comprehensive understanding
of rGO–solution interfaces (specifically, electrochemical interfacial
properties influenced by linker molecules and surface chemistry) remains
challenging, given the limited capability of analytical tools to directly
measure intricate solution interface properties. In this study, we
introduce an analytical tool designed to directly measure the surface
charge density of the rGO–solution interface leveraging the
remote floating-gate FET (RFGFET) platform. Our methodology involves
characterizing the electrochemical properties of rGO, which are influenced
by adhesion layers between SiO2 and rGO, such as (3-aminopropyl)trimethoxysilane
(APTMS) and hexamethyldisilazane (HMDS). The hydrophilic nature of
APTMS facilitates the acceptance of oxygen-rich rGO, resulting in
a noteworthy pH sensitivity of 56.8 mV/pH at the rGO–solution
interface. Conversely, hydrophobic HMDS significantly suppresses the
pH sensitivity from the rGO–solution interface, attributed
to the graphitic carbon-rich surface of rGO. Consequently, the carbon-rich
surface facilitates a denser arrangement of 1-pyrenebutyric acid N-hydroxysuccinimide ester linkers for functionalizing capturing
probes on rGO, resulting in an enhanced sensitivity of lead ions by
32% in our proof-of-concept test.