posted on 2020-04-30, 15:03authored byJie Wu, Fengmei Gao, Gang Shao, Zhentao Du, Weiyou Yang, Lin Wang, Zhenxia Wang, Shanliang Chen
Improving
the sensitivity of the piezoresistive behavior of semiconductor
nanostructures is critically important because it is one of the keys
to explore advanced pressure sensors with desired sensitivity. Herein,
we reported a strategy for improving the piezoresistive behavior of
SiC nanowire by coupling with the piezoelectric effect of ZnO nanolayers,
which were grown by an atomic layer deposition approach. As a result,
the detected current of the as-constructed ZnO/SiC heterojunction
nanowires is 6 times more than SiC nanowires, suggesting its substantially
improved sensitivity. Moreover, the measured ΔR/R0 value and gauge factor (GF) of the
ZnO/SiC heterojunction nanowires could be up to 0.82 and 50.93, respectively,
which was profoundly higher than those of the SiC counterpart and
most of reported positive piezoresistive SiC sensors.