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Electrical Resistivity of Assembled Transparent Inorganic Oxide Nanoparticle Thin Layers: Influence of Silica, Insulating Impurities, and Surfactant Layer Thickness
journal contribution
posted on 2012-05-23, 00:00 authored by Stephanie
B. Bubenhofer, Christoph M. Schumacher, Fabian M. Koehler, Norman A. Luechinger, Georgios A. Sotiriou, Robert N. Grass, Wendelin J. StarkThe electrical properties of transparent, conductive
layers prepared
from nanoparticle dispersions of doped oxides are highly sensitive
to impurities. Production of cost-effective thin conducting films
for consumer electronics often employs wet processing such as spin
and/or dip coating of surfactant-stabilized nanoparticle dispersions.
This inherently results in entrainment of organic and inorganic impurities
into the conducting layer leading to largely varying electrical conductivity.
Therefore, this study provides a systematic investigation on the effect
of insulating surfactants, small organic molecules and silica in terms
of pressure dependent electrical resistivity as a result of different
core/shell structures (layer thickness). Application of high temperature
flame synthesis gives access to antimony-doped tin oxide (ATO) nanoparticles
with high purity. This well-defined starting material was then subjected
to representative film preparation processes using organic additives.
In addition ATO nanoparticles were prepared with a homogeneous inorganic
silica layer (silica layer thickness from 0.7 to 2 nm). Testing both
organic and inorganic shell materials for the electronic transport
through the nanoparticle composite allowed a systematic study on the
influence of surface adsorbates (e.g., organic, insulating materials
on the conducting nanoparticle’s surface) in comparison to
well-known insulators such as silica. Insulating impurities or shells
revealed a dominant influence of a tunneling effect on the overall
layer resistance. Mechanical relaxation phenomena were found for 2
nm insulating shells for both large polymer surfactants and (inorganic)
SiO2 shells.