The local mechanical properties of
crystalline polymer were evaluated
using synchrotron radiation X-ray diffraction with 10 μm lateral
resolution. A nonoriented isotactic polypropylene (iPP) film with
isolated spherulites in a crystallized matrix was used as a model
sample. In situ wide-angle X-ray diffraction (WAXD) measurement was
performed on the iPP film using a microbeam synchrotron radiation
X-ray under sinusoidal strain. The lattice spacing of the crystal
planes increased and decreased in response to the applied sinusoidal
strain. Local dynamic viscoelastic functions (dynamic storage and
loss moduli (E′ and E″)) were calculated at room temperature from the
relationship between the calculated applied stress and the response
strain obtained by dynamic μ-beam WAXD measurement inside and
outside of the spherulites. The E′ values
inside and outside of spherulite obtained from the change in spacing
of the (110) plane were 1.8 and 1.1 GPa, respectively. Furthermore,
the E′ value inside of spherulite obtained
from the change in spacing of the (1̅13) plane was 6.0 GPa.
These values can be explained by the deformation of crystallite, which
depends on the direction of crystal planes. The results obtained here
revealed that synchrotron radiation X-ray diffraction measurement
gives not only structural information but also the local mechanical
properties of the materials E′.