posted on 2025-02-12, 02:03authored byIan E. Campbell, Aashi Gupta, Pavlina Metaxa, A. Arifutzzaman, Tao Ma, Paula Arellano, Ray Duffy, Ageeth A. Bol
Atomic layer deposition (ALD), with its precise process
control
and conformality, has recently gained interest for synthesizing transition
metal sulfides like MoS2, which have varied applications
in low-dimensional electronics and electrocatalysts. Hydrogen sulfide
(H2S) has been used in many sulfide ALD processes; however,
H2S is a toxic gas that requires expensive containment
and abatement measures for shipping, installation, and storage. Herein,
we report a PEALD process capable of synthesizing MoS2 without
H2S. This process utilizes a Mo precursor commonly used
in ALD, hydrogen plasma, and di-tert-butyl disulfide
(TBDS), which is a liquid that is significantly less hazardous and
expensive than H2S. It was found that the TBDS-based PEALD
process results in layered, stoichiometric MoS2 with limited
contamination. The TBDS-based PEALD process was also analyzed via
mass spectrometry to determine the mechanistic roles of each reactant.
Apparently, H2 plasma removes ligands from the chemisorbed
Mo precursor, which allows TBDS to sulfurize the top layer, producing
H2S and isobutene as byproducts. MoS2 films
deposited via the TBDS-based process possessed fewer yet taller out-of-plane
growths and similar crystal grain diameter (∼10 nm) and electrical
resistivity (13.6–15.5 Ω·cm for 3 nm thick films)
compared to films made with H2S. Thus, the TBDS-based process
is a suitable and safer alternative to the H2S-based process
for large-area synthesis of layered MoS2.