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Development of a Phase-Controlled Constant-Distance Scanning Electrochemical Microscope

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journal contribution
posted on 2009-05-01, 00:00 authored by Charles Cougnon, Klaus Bauer-Espindola, Dimitri S. Fabre, Janine Mauzeroll
The present shear-force constant-distance scanning electrochemical microscope regulates tip-to-substrate distance using a phase-controlled feedback mechanism that is more sensitive than the amplitude-controlled constant-distance scanning electrochemical microscopes. Phase control responds faster to frequency perturbation and presents enhance sensitivity during distance curves under constant-distance mode.