Decomposition of Metal Alkylamides, Alkyls, and Halides
at Reducible Oxide Surfaces: Mechanism of ‘Clean-up’
During Atomic Layer Deposition of Dielectrics onto III–V Substrates
posted on 2014-04-08, 00:00authored bySylwia Klejna, Simon D. Elliott
The pairing of high-k dielectric materials with
high electron mobility semiconductors for transistors is facilitated
when atomic layer deposition (ALD) is used to deposit the dielectric
film. An interfacial cleaning mechanism (‘clean-up’)
that results in consumption of semiconductor native oxides and in
practically sharp dielectric/semiconductor interfaces has been observed
during ALD of Al2O3, HfO2, TiO2, and Ta2O5 with various degrees of
success. We undertake a comprehensive study using density functional
theory (DFT) to explain differences in the performance of various
classes of precursor chemicals in removing native oxide from III–V
substrates. The study covers the metals Ta(V), Ti(IV), Zr(IV), Hf(IV),
Al(III), Mg(II) combined with methyl, amide, and chloride ligands.
Of these, we show that clean-up is most effective when depositing
MgO. Clean-up with metal alkylamides has a similar mechanism to clean-up
with metal methyls insofar as oxygen is scavenged by the metal. The
difference in operation of alkylamide and methyl ligands lies in the
affinity of the ligand to the substrate. Alkylamide is shown to be
prone to decomposition rather than the migration of the entire ligand
evinced by methyl. We investigate the multistep chemical processes
associated with decomposition of alkylamide. These processes can also
occur during later cycles of high-k ALD and give
a chemical vapor deposition (CVD) component to the ALD process. These
transformations lead to formation of clean-up products such as aziridine,
ethene, N-methyl methyleneimine, hydrogen cyanide, and methane. Somebut
not allof the reactions lead to reduction of surface As2O3 (i.e., clean-up). These results explain the
experimentally observed accumulation of metallic arsenic and arsenic
suboxide at the interface. Such understanding can help achieve control
of oxide-semiconductor interfaces through the appropriate choice of
chemical precursor.