posted on 2013-05-30, 00:00authored byGongming Wang, Yichuan Ling, Xihong Lu, Fang Qian, Yexiang Tong, Jin Z. Zhang, Vincenzo Lordi, Cedric Rocha Leao, Yat Li
We
demonstrate hydrogenation as a facile method to significantly enhance
the performance of BiVO4 films for photoelectrochemical
water oxidation. Hydrogenation was performed for BiVO4 films
by annealing them in hydrogen atmosphere at elevated temperatures
between 200 and 400 °C. Hydrogen gas can reduce BiVO4 to form oxygen vacancies as well as hydrogen impurities. DFT calculation
predicted that both oxygen vacancies and hydrogen impurities are shallow
donors for BiVO4 with low formation energies. These defects
could increase the donor densities of BiVO4 without introducing
deep trap states. Electrochemical impedance measurements showed that
the donor densities of BiVO4 films were significantly enhanced
upon hydrogenation. Hydrogen-treated BiVO4 (H-BiVO4) photoanodes achieved a maximum photocurrent density of 3.5
mA/cm2 at 1.0 V vs Ag/AgCl, which is 1 order of magnitude
higher than that of air-annealed BiVO4 obtained at the
same potential. The enhanced photoactivities were attributed to increased
donor densities of H-BiVO4, which facilitates the charge
transport and collection.