Atomic-Monolayer Two-Dimensional Lateral Quasi-Heterojunction Bipolar Transistors with Resonant Tunneling Phenomenon
journal contributionposted on 04.10.2017, 00:00 by Che-Yu Lin, Xiaodan Zhu, Shin-Hung Tsai, Shiao-Po Tsai, Sidong Lei, Yumeng Shi, Lain-Jong Li, Shyh-Jer Huang, Wen-Fa Wu, Wen-Kuan Yeh, Yan-Kuin Su, Kang L. Wang, Yann-Wen Lan
High-frequency operation with ultrathin, lightweight, and extremely flexible semiconducting electronics is highly desirable for the development of mobile devices, wearable electronic systems, and defense technologies. In this work, the experimental observation of quasi-heterojunction bipolar transistors utilizing a monolayer of the lateral WSe2–MoS2 junctions as the conducting p–n channel is demonstrated. Both lateral n–p–n and p–n–p heterojunction bipolar transistors are fabricated to exhibit the output characteristics and current gain. A maximum common-emitter current gain of around 3 is obtained in our prototype two-dimensional quasi-heterojunction bipolar transistors. Interestingly, we also observe the negative differential resistance in the electrical characteristics. A potential mechanism is that the negative differential resistance is induced by resonant tunneling phenomenon due to the formation of quantum well under applying high bias voltages. Our results open the door to two-dimensional materials for high-frequency, high-speed, high-density, and flexible electronics.