posted on 2018-08-05, 00:00authored byPrudhvidhar Gaddam, Robert Grayson, William Ducker
We
describe measurements of adsorption between two flat plates
when the plates are separated by 0–65 nm. The objective is
to examine how adsorption is affected by confinement in very thin
films. It is well known that adsorption of simple ions can change
with the thickness of a thin film (charge regulation); here, we describe
a direct method to measure adsorption as a function of confinement
and results for one example. Measurement of all separations is achieved
simultaneously by measuring visible-light interference in a wedge-shaped
crack created between an oxidized silicon wafer and a glass wafer.
The adsorbed amount is measured from the fluorescence emission of
a dye, after accounting for the optical interference. The specific
measurement is of the depletion of a divalent anion, fluorescein,
in aqueous solution between two anionic solids, but the measurement
could be applied to a range of fluorescent probes. At large separations
between the flat plates, the dye is depleted relative to the bulk
concentration. At smaller separations, the depletion of the dye decreases.
The range of the depletion and the magnitude of depletion decrease
with shorter Debye length. Both of these effects are consistent with
a simple calculation using the Poisson–Boltzmann equation.
There is a multitude of applications where surfactants, polymers,
ions, etc. are adsorbed to effect changes in thin films. One example
is adsorption designed to alter the stability of colloidal particles.