mz9b00894_si_001.pdf (868.74 kB)
Thin Polymer Film Force Spectroscopy: Single Chain Pull-out and Desorption
journal contribution
posted on 2020-01-14, 13:08 authored by Jake McClements, Vasileios KoutsosAtomic force microscopy
(AFM) was utilized to investigate the force associated with chain
pull-out and single chain desorption of poly(styrene-co-butadiene) random copolymer thin films on mica, silicon, and graphite
substrates. Chain pull-out events were common and produced a force
of 20–25 pN. The polymer desorption force was strongest on
the graphite substrate and weakest on the mica, which agreed with
the calculated work of adhesion for each system and the substrate
hydrophobicity. Furthermore, it was demonstrated that there was a
systematic order to when each of these phenomena occurred during the
tip retraction from the surface, which provided information about
the structure of the thin films.