nn7b06658_si_001.pdf (1.18 MB)
Nano-electromechanical Switch Based on a Physical Unclonable Function for Highly Robust and Stable Performance in Harsh Environments
journal contribution
posted on 2017-12-13, 00:00 authored by Kyu-Man Hwang, Jun-Young Park, Hagyoul Bae, Seung-Wook Lee, Choong-Ki Kim, Myungsoo Seo, Hwon Im, Do-Hyun Kim, Seong-Yeon Kim, Geon-Beom Lee, Yang-Kyu ChoiA physical
unclonable function (PUF) device using a nano-electromechanical
(NEM) switch was demonstrated. The most important feature of the NEM-switch-based
PUF is its use of stiction. Stiction is one of the chronic problems
associated with micro- and nano-electromechanical system (MEMS/NEMS)
devices; however, here, it was utilized to intentionally implement
a PUF for hardware-based security. The stiction is caused by capillary
and van der Waals forces, producing strong adhesion, which can be
utilized to design a highly robust and stable PUF. The probability
that stiction will occur on either of two gates in the NEM switch
is the same, and consequently, the occurrence of the stiction is random
and unique, which is critical to its PUF performance. This uniqueness
was evaluated by measuring the interchip Hamming distance (interchip
HD), which characterizes how different responses are made when the
same challenge is applied. Uniformity was also evaluated by the proportion
of “1” or “0” in the response bit-string.
The reliability of the proposed PUF device was assessed by stress
tests under harsh environments such as high temperature, high dose
radiation, and microwaves.
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NEM-switch-based PUFvan der Waals forcesPUF devicePUF performanceNano-electromechanical SwitchNEM switchHDdose radiationnano-electromechanical systemstictionHarsh Environmentsinterchip Hamming distanceMEMSstress testsunclonable functionresponse bit-stringPhysical Unclonable Functionhardware-based securityStable Performance
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