nn6b06534_si_001.pdf (3.12 MB)
Integrating Sphere Microscopy for Direct Absorption Measurements of Single Nanostructures
journal contribution
posted on 2017-01-05, 00:00 authored by Sander
A. Mann, Beniamino Sciacca, Yunyan Zhang, Jia Wang, Evgenia Kontoleta, Huiyun Liu, Erik C. GarnettNanoscale materials
are promising for optoelectronic devices because
their physical dimensions are on the order of the wavelength of light.
This leads to a variety of complex optical phenomena that, for instance,
enhance absorption and emission. However, quantifying the performance
of these nanoscale devices frequently requires measuring absolute
absorption at the nanoscale, and remarkably, there is no general method
capable of doing so directly. Here, we present such a method based
on an integrating sphere but modified to achieve submicron spatial
resolution. We explore the limits of this technique by using it to
measure spatial and spectral absorptance profiles on a wide variety
of nanoscale systems, including different combinations of weakly and
strongly absorbing and scattering nanomaterials (Si and GaAs nanowires,
Au nanoparticles). This measurement technique provides quantitative
information about local optical properties that are crucial for improving
any optoelectronic device with nanoscale dimensions or nanoscale surface
texturing.
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GaAs nanowiresSingle Nanostructures Nanoscale materialsDirect Absorption Measurementsvarietyabsorptionnanoscale surface texturingoptoelectronic devicemethodmeasurement techniqueabsorptance profilesIntegrating Sphere Microscopynanoscale systemsnanoscale devicesnanoscale dimensionsoptoelectronic devices
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