jz9b02670_si_001.pdf (666.51 kB)
Direct Probing of Oxygen Loss from the Surface Lattice of Correlated Oxides during Hydrogen Spillover
journal contribution
posted on 2019-11-12, 11:29 authored by Hyojin Yoon, Yongjin Kim, Ethan J. Crumlin, Donghwa Lee, Kyuwook Ihm, Junwoo SonHydrogen
spillover is a catalytic process that occurs by surface
reaction and subsequent diffusion to reversibly provide a massive
amount of hydrogen dopants in correlated oxides, but the mechanism
at the surface of correlated oxides with metal catalyst are not well
understood. Here we show that a significant amount of oxygen is released
from the surface of correlated VO2 films during hydrogen
spillover, contrary to the well-established observation of the formation
of hydrogen interstitials in the bulk part of VO2 films.
By using ambient-pressure X-ray photoelectron spectroscopy, we prove
that the formation of surface oxygen vacancies is a consequence of
a favorable reaction for the generation of weakly adsorbed H2O from surface O atoms that have low coordination and weak binding
strength. Our results reveal the importance of in situ characterization
to prove the dynamic change during redox reaction and present an opportunity
to control intrinsic defects at the surface.
History
Usage metrics
Categories
Keywords
surface reactionOxygen Lossredox reactionambient-pressure X-ray photoelectron spectroscopyhydrogen spilloverhydrogen dopantsHydrogen Spillover Hydrogen spilloversurface oxygen vacanciesbinding strengthSurface Latticemetal catalystH 2 Obulk partVO 2 filmssurface O atomshydrogen interstitialsCorrelated Oxides
Licence
Exports
RefWorks
BibTeX
Ref. manager
Endnote
DataCite
NLM
DC