Direct Damage of Deoxyadenosine Monophosphate by Low-Energy Electrons Probed by X‑ray Photoelectron Spectroscopy

Low-energy (3–25 eV) electron interactions with multilayers of 2′-deoxyadenosine 5′-monophosphate (dAMP) were probed using X-ray photoelectron spectroscopy (XPS). Understanding how electrons damage the nucleotide dAMP, which is a building block of DNA, can give insight into how the DNA undergoes radiation damage. Chemical modifications to the constituent units of the nucleotide were revealed in situ through monitoring of the O 1s, C 1s, and N 1s elemental transitions. It is shown that direct electron irradiation causes decomposition of both the base and sugar subunits, as well as cleavage of glycosidic and phosphoester bonds. Incident electrons undergo inelastic energy losses, including creation of core-excited resonances above 3–4 eV. In the condensed phase, these resonances decay via autoionization, producing electronically excited targets and <3 eV electrons. The excited states dissociate and the slow (<3 eV) electrons are captured by neighboring molecules, forming molecular shape resonances that can lead to bond rupture. Since the observed chemical changes were similar at all incident electron energies studied, they can be primarily attributed to formation and decay of transient negative ions. Damage enhancements in the energy ranges typical of all scattering resonances are expected, with the damage probability dominated by the low-energy shape resonances.