10.1021/acs.jpcc.8b10496.s001
Jing Yang
Jing
Yang
Hiroyo Kawai
Hiroyo
Kawai
Calvin Pei Yu Wong
Calvin
Pei Yu Wong
Kuan Eng Johnson Goh
Kuan Eng Johnson
Goh
Electrical Doping Effect of Vacancies on Monolayer
MoS<sub>2</sub>
American Chemical Society
2019
monolayer MoS 2
p-type Schottky contact behaviors
Monolayer MoS 2 Doping
scanning tunneling microscopy results
Electrical Doping Effect
p-type semiconductor characteristics
interface
electron doping level
TMDC
V S
defect
concentration
X-ray photoelectron spectroscopy
2019-02-07 00:00:00
Journal contribution
https://acs.figshare.com/articles/journal_contribution/Electrical_Doping_Effect_of_Vacancies_on_Monolayer_MoS_sub_2_sub_/7687109
Doping
of transition-metal dichalcogenides (TMDCs) is an effective
way to tune the Fermi level to facilitate the band engineering required
for different types of devices. For TMDCs, a controversy abounds with
regard to the doping role played by vacancy-type defects. Here, we
report a detailed study based on first-principles calculations proposing
that the native sulfur vacancies (V<sub>S</sub>) can significantly
alter the electrical doping level in MoS<sub>2</sub> and tune the
material to exhibit conventional n- or p-type semiconductor characteristics.
In particular, we reveal that the lower concentration of the single
V<sub>S</sub> (2.8 and 6.3%) yields p-type characteristics, whereas
the higher concentration of the single V<sub>S</sub> or a cluster
of V<sub>S</sub> (12.5, 18.8, and 25.0%) yields n-type characteristics.
The trend is consistent with previous X-ray photoelectron spectroscopy
and scanning tunneling microscopy results. Employing this method of
tuning the electron doping level, we modeled a commonly used metal–semiconductor
interface to demonstrate both n- and p-type Schottky contact behaviors.
Interestingly, we found that the defect configuration could also tune
the doping and hence the contact. Simulation of the electric current
at the interface as a function of the bias voltage provides a reference
for how the electrical characteristics would shift on the basis of
the change in vacancy concentration. Our study reveals that the V<sub>S</sub> of monolayer MoS<sub>2</sub> at the MoS<sub>2</sub>–metal
interface play an important role in determining its electrical behavior
and suggests that developing methods to control or engineer such defects
for controlling the electron doping level could be a viable alternative
to conventional doping with foreign atoms.