10.1021/acsnano.7b06658.s001
Kyu-Man Hwang
Kyu-Man
Hwang
Jun-Young Park
Jun-Young
Park
Hagyoul Bae
Hagyoul
Bae
Seung-Wook Lee
Seung-Wook
Lee
Choong-Ki Kim
Choong-Ki
Kim
Myungsoo Seo
Myungsoo
Seo
Hwon Im
Hwon
Im
Do-Hyun Kim
Do-Hyun
Kim
Seong-Yeon Kim
Seong-Yeon
Kim
Geon-Beom Lee
Geon-Beom
Lee
Yang-Kyu Choi
Yang-Kyu
Choi
Nano-electromechanical
Switch Based on a Physical
Unclonable Function for Highly Robust and Stable Performance in Harsh
Environments
American Chemical Society
2017
NEM-switch-based PUF
van der Waals forces
PUF device
PUF performance
Nano-electromechanical Switch
NEM switch
HD
dose radiation
nano-electromechanical system
stiction
Harsh Environments
interchip Hamming distance
MEMS
stress tests
unclonable function
response bit-string
Physical Unclonable Function
hardware-based security
Stable Performance
2017-12-13 00:00:00
Journal contribution
https://acs.figshare.com/articles/journal_contribution/Nano-electromechanical_Switch_Based_on_a_Physical_Unclonable_Function_for_Highly_Robust_and_Stable_Performance_in_Harsh_Environments/5697403
A physical
unclonable function (PUF) device using a nano-electromechanical
(NEM) switch was demonstrated. The most important feature of the NEM-switch-based
PUF is its use of stiction. Stiction is one of the chronic problems
associated with micro- and nano-electromechanical system (MEMS/NEMS)
devices; however, here, it was utilized to intentionally implement
a PUF for hardware-based security. The stiction is caused by capillary
and van der Waals forces, producing strong adhesion, which can be
utilized to design a highly robust and stable PUF. The probability
that stiction will occur on either of two gates in the NEM switch
is the same, and consequently, the occurrence of the stiction is random
and unique, which is critical to its PUF performance. This uniqueness
was evaluated by measuring the interchip Hamming distance (interchip
HD), which characterizes how different responses are made when the
same challenge is applied. Uniformity was also evaluated by the proportion
of “1” or “0” in the response bit-string.
The reliability of the proposed PUF device was assessed by stress
tests under harsh environments such as high temperature, high dose
radiation, and microwaves.