10.1021/nl050018d.s001
David P. Burt
David P.
Burt
Neil R. Wilson
Neil R.
Wilson
John M. R. Weaver
John
M. R. Weaver
Phillip S. Dobson
Phillip S.
Dobson
Julie V. Macpherson
Julie V.
Macpherson
Nanowire Probes for High Resolution
Combined Scanning Electrochemical
Microscopy − Atomic Force Microscopy
American Chemical Society
2005
coating
nanowire tips
AFM tip apex
probe end
topographical imaging
force microscopy
Nanowire Probes
electrochemical activity
Microscopy
nanoelectrode
High Resolution
Subsequent deposition
2005-04-13 00:00:00
Journal contribution
https://acs.figshare.com/articles/journal_contribution/Nanowire_Probes_for_High_Resolution_Combined_Scanning_Electrochemical_Microscopy_Atomic_Force_Microscopy/3291796
We describe a method for the production of nanoelectrodes at the apex of atomic force microscopy (AFM) probes. The nanoelectrodes are
formed from single-walled carbon nanotube AFM tips which act as the template for the formation of nanowire tips through sputter coating
with metal. Subsequent deposition of a conformal insulating coating, and cutting of the probe end, yields a disk-shaped nanoelectrode at the
AFM tip apex whose diameter is defined by the amount of metal deposited. We demonstrate that these probes are capable of high-resolution
combined electrochemical and topographical imaging. The flexibility of this approach will allow the fabrication of nanoelectrodes of controllable
size and composition, enabling the study of electrochemical activity at the nanoscale.