10.1021/la8028676.s001
Arkadiusz Ptak
Arkadiusz
Ptak
Michael Kappl
Michael
Kappl
Susana Moreno-Flores
Susana
Moreno-Flores
Hubert Gojzewski
Hubert
Gojzewski
Hans-Jürgen Butt
Hans-Jürgen
Butt
Quantitative Characterization of Nanoadhesion by Dynamic Force Spectroscopy
American Chemical Society
2009
silicon nitride tip
characterization
nanocontact
Quantitative Characterization
Adhesion
logarithmic terms
information
force microscope
Dynamic Force SpectroscopyWe
Nanoadhesion
application
nonanethiol
method
nanoadhesion
component
energy barrier
loading rates
extraction
adhesion
monolayer
contact mechanics
model
bond
2009-01-06 00:00:00
Journal contribution
https://acs.figshare.com/articles/journal_contribution/Quantitative_Characterization_of_Nanoadhesion_by_Dynamic_Force_Spectroscopy/2887732
We present a method for the characterization of adhesive bonds formed in nanocontacts. Using a modified atomic force microscope, the nanoadhesion between a silicon nitride tip and a self-assembled monolayer of 1-nonanethiol on gold(111) was measured at different loading rates. Adhesion force-versus-loading rate curves could be fitted with two logarithmic terms, indicating a two step (two energy barrier) process. The application of the Bell−Evans model and classical contact mechanics allows the extraction of quantitative information about the effective adhesion potential and characterization of the different components contributing to nanoadhesion.