10.1021/la8028676.s001 Arkadiusz Ptak Arkadiusz Ptak Michael Kappl Michael Kappl Susana Moreno-Flores Susana Moreno-Flores Hubert Gojzewski Hubert Gojzewski Hans-Jürgen Butt Hans-Jürgen Butt Quantitative Characterization of Nanoadhesion by Dynamic Force Spectroscopy American Chemical Society 2009 silicon nitride tip characterization nanocontact Quantitative Characterization Adhesion logarithmic terms information force microscope Dynamic Force SpectroscopyWe Nanoadhesion application nonanethiol method nanoadhesion component energy barrier loading rates extraction adhesion monolayer contact mechanics model bond 2009-01-06 00:00:00 Journal contribution https://acs.figshare.com/articles/journal_contribution/Quantitative_Characterization_of_Nanoadhesion_by_Dynamic_Force_Spectroscopy/2887732 We present a method for the characterization of adhesive bonds formed in nanocontacts. Using a modified atomic force microscope, the nanoadhesion between a silicon nitride tip and a self-assembled monolayer of 1-nonanethiol on gold(111) was measured at different loading rates. Adhesion force-versus-loading rate curves could be fitted with two logarithmic terms, indicating a two step (two energy barrier) process. The application of the Bell−Evans model and classical contact mechanics allows the extraction of quantitative information about the effective adhesion potential and characterization of the different components contributing to nanoadhesion.