10.1021/nn900081u.s002
Violetta Olszowka
Violetta
Olszowka
Markus Hund
Markus
Hund
Volker Kuntermann
Volker
Kuntermann
Sabine Scherdel
Sabine
Scherdel
Larisa Tsarkova
Larisa
Tsarkova
Alexander Böker
Alexander
Böker
Electric Field Alignment of a Block Copolymer Nanopattern: Direct Observation of the Microscopic Mechanism
American Chemical Society
2009
topological defects
Block Copolymer Nanopattern
Electric Field Alignment
SFM
film
evolution
orientational order parameter
ABC terblock copolymer
2009-05-26 00:00:00
Media
https://acs.figshare.com/articles/media/Electric_Field_Alignment_of_a_Block_Copolymer_Nanopattern_Direct_Observation_of_the_Microscopic_Mechanism/2854792
Using quasi<i>-in-situ</i> scanning force microscopy we study the details of nanopattern alignment in ABC terblock copolymer thin films in the presence of an in-plane electric field. Because of the surface interactions and electric field the lamellae are oriented both perpendicular to the plane of the film and parallel to the electric field. We identified two distinct defect types which govern the orientation mechanism. Ring-like (tori) and open-end defects dominate at the early stage of the orientation process, while mainly classic topological defects (disclinations and dislocations) are involved in long-range ordering at the late stages. Comparison of the time evolution of the defect density with the evolution of the orientational order parameter suggests that tori-defects are essential for the effective reorientation. Further, the quasi<i>-in-situ</i> SFM imaging allowed us to elucidate the influence of the electric field strength on the propagation velocity of the topological defects.